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Towards Prognosis on Interconnected Distributed Closed-Loop Control System: A Data-Driven Perspective

Year: 2025

Type: conference-paper

Source: IEEE International Symposium on Industrial Electronics (ISIE)

DOI: 10.1109/isie62713.2025.11124620

Authors: Jiusi Zhang, Jilun Tian, Kexin Liu, Hao Luo, Shen Yin

Institutions: University of Electronic Science and Technology of China, Harbin Institute of Technology, Harbin Engineering University, Norwegian University of Science and Technology

Language: English

Topic: Fault Detection and Control Systems

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4413513864

FWCI:

Cites: 17

Cited by:

Related to: 10