Robust low-temperature ferroelectric behavior of Al0.75Sc0.25N films
Year: 2025
Type: article
Source: Applied Physics Letters
DOI: 10.1063/5.0273865
Authors: Dan Li, Mingrui Liu, Shuai Wang, Yuping Jia, Ke Jiang, Hang Zang, Rui Sun, Xiaojuan Sun, Dabing Li
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4413518820
