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FastRecon++: Enhancing Few-Shot Anomaly Detection for Electric Vehicle Manufacturing

Year: 2025

Type: conference-paper

Source: IEEE International Symposium on Industrial Electronics (ISIE)

DOI: 10.1109/isie62713.2025.11124813

Authors: Nasrin Tavakoli, Rajeev Verma, Atefeh Gilvari, Narayan C. Kar, Ziad Kobti

Institutions: University of Windsor, Magna International (United States)

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4413556693

FWCI:

Cites: 23

Cited by:

Related to: 10