Work

Simplified Analytical Loss Analysis for Early Exclusion of Unsuitable MOSFET Candidates

Year: 2025

Type: conference-paper

Source: IEEE International Symposium on Industrial Electronics (ISIE)

DOI: 10.1109/isie62713.2025.11124602

Authors: Aron Haselhoff, Sascha Kratz, Stefan Soter

Institution: University of Wuppertal

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413556949

FWCI:

Cites: 6

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Related to: 10