BRUCE: a metrological system for characterizing the beam-intensity rotational uniformity of side-scanning optical miniature probes
Year: 2025
Type: article
Source: Applied Optics
DOI: 10.1364/ao.573028
Authors: Jin Young Youm, Joon-Mo Yang
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4413628524
