From Classical Algorithms to AI: Evolving Trends in VLSI Physical Design Automation
Year: 2025
Type: article
Source: IEEE Design and Test
Authors: David Z. Pan, Yao-Wen Chang, Chen-Hao Hsu, Yang Hsu
Institutions: The University of Texas at Austin, National Taiwan University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4413640123