Work

RF Leakage in Embedded Devices: Security and Reliability Risks

Year: 2025

Type: article

Source: IEEE Design and Test

DOI: 10.1109/mdat.2025.3602736

Authors: Erez Danieli, Yoav Weizman, David Popovtzer, Itamar Levi

Institution: Bar-Ilan University

Language: English

Topic: Security and Verification in Computing

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413640135

FWCI:

Cites: 14

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Related to: 10