Work

DAAS: Differential Aging-Aware STA for Precise Timing Closure With Reduced Design Margin

Year: 2025

Type: article

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2025.3603098

Authors: Lomash Chandra Acharya, Neha Gupta, Khoirom Johnson Singh, Mahipal Dargupally, Neeraj Mishra, Arvind Kumar Sharma, Ajoy Mandal, Venkatraman Ramakrishnan, Sudeb Dasgupta, Anand Bulusu

Institutions: Indian Institute of Technology Roorkee, Birla Institute of Technology and Science, Pilani, IMEC, Texas Instruments (India)

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413677338

FWCI: 0.462

Cites: 30

Cited by: 2

Related to: 10