Work

Robust Multilabel Feature Selection With Label Enhancement for Fault Diagnosis

Year: 2025

Type: article

Source: IEEE Transactions on Systems Man and Cybernetics Systems

DOI: 10.1109/tsmc.2025.3598796

Authors: Qingqi Han, Wei Zhang, Chi Ma, Jialong He, Wanfu Gao

Institutions: Jilin University, Key Laboratory of Symbolic Computation and Knowledge Engineering of Ministry of Education, Jilin University, Chongqing University, State Key Laboratory of Mechanical Transmission

Language: English

Topic: Machine Fault Diagnosis Techniques

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Youth Science Foundation of Jilin Province, Changchun Science and Technology Planning Project

Awards: G4561610229, G8113177787

OpenAlex ID: W4413677484

FWCI: 2.744

Cites: 35

Cited by: 7

Related to: 10