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Why Good Detectors Can Make Bad Trackers: mAP Worse than Random Chance at Model Selection

Year: 2025

Type: conference-paper

DOI: 10.1109/eras63351.2025.11135796

Authors: Trenton Tabor, Tomasz Swierzewski, Casidhe Hutchison, Oren Wright, Eric Heim, Christopher S. Timperley

Institutions: Carnegie Mellon University, Software Engineering Institute

Language: English

Topic: Advanced Neural Network Applications

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: Carnegie Mellon University

OpenAlex ID: W4413755402

FWCI: 0.857

Cites: 15

Cited by: 1

Related to: 10