Work

In-Field Monitoring and Preventing Read Disturb Faults in RRAMs

Year: 2025

Type: conference-paper

Source: Proceedings/Proceedings - European Test Workshop

DOI: 10.1109/ets63895.2025.11049639

Authors: Hanzhi Xun, Moritz Fieback, Sicong Yuan, Changhao Wang, Erbing Hua, Hassen Aziza, Leticia Bolzani Poehls, Riccardo Cantoro, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui

Institutions: Delft University of Technology, Politecnico di Torino, Aix-Marseille Université, Leibniz Institute for High Performance Microelectronics

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413755434

FWCI: 4.554

Cites:

Cited by: 2

Related to: 10