Work

Calibration Features of the Atomic Force Microscope Scanning Device

Year: 2025

Type: conference-paper

DOI: 10.21667/978-5-7722-0424-5-108-111

Authors: V.V. Kuklev, N.V. Vishnyakov

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413798478

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