In Situ Measurement and Physical Mechanism of Dynamic R ON in GaN-on-Si Monolithic Half-Bridge Power IC
Year: 2025
Type: article
Authors: Xin Yang, Hongchang Cui, Zineng Yang, Matthew Porter, Bin Lu, Yuhao Zhang
Institutions: University of Hong Kong, Virginia Tech
Language: English
Subfield: Condensed Matter Physics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4413822113