Work

Defect Stability in CdTe: Formation Energies and Migration Barriers

Year: 2025

Type: conference-paper

Source: Conference record of the IEEE Photovoltaic Specialists Conference

DOI: 10.1109/pvsc59419.2025.11132484

Authors: Intuon Chatratin, Igor Evangelista, Anderson Janotti

Institution: University of Delaware

Language: English

Topic: Chalcogenide Semiconductor Thin Films

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: U.S. Department of Energy, Solar Energy Technologies Office

OpenAlex ID: W4413822210

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