Work

Characterisation of Potential-Induced Degradation Shunting in c-Si PV Modules Using Electroluminescence and Infrared Imaging

Year: 2025

Type: conference-paper

Source: Conference record of the IEEE Photovoltaic Specialists Conference

DOI: 10.1109/pvsc59419.2025.11133323

Authors: Ravi Kumar, Rajesh Gupta

Institution: Indian Institute of Technology Bombay

Language: English

Topic: Silicon and Solar Cell Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Affordable and clean energy, Industry, innovation and infrastructure

Open Access status: closed

Funder: Ministry of Education

OpenAlex ID: W4413822250

FWCI:

Cites: 7

Cited by:

Related to: 10