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Understanding Solar Module Test Failures: Key Takeaways from Kiwa PVEL’s PV Module Reliability Scorecard

Year: 2025

Type: conference-paper

Source: Conference record of the IEEE Photovoltaic Specialists Conference

DOI: 10.1109/pvsc59419.2025.11132769

Authors: Todd Karin, Jean-Nicholas Jaubert, Archana Sinha, Tristan Erion-Lorico

Language: English

Topic: Silicon and Solar Cell Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413822343

FWCI:

Cites: 2

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Related to: 10