Work

Multi-Isotopic Analysis for Robust Traceability of Crystalline Silicon Wafers

Year: 2025

Type: conference-paper

Source: Conference record of the IEEE Photovoltaic Specialists Conference

DOI: 10.1109/pvsc59419.2025.11133388

Authors: Bertrand Paviet-Salomon, Sylvain Bérail, Julien Barre, Christophe Pecheyran

Institutions: Swiss Center for Electronics and Microtechnology (Switzerland), Centre National de la Recherche Scientifique, Université de Pau et des Pays de l'Adour, Institut des Sciences Analytiques et de Physico-Chimie pour l'Environnement et les Matériaux

Language: English

Topic: Analytical chemistry methods development

Subfield: Analytical Chemistry

Field: Chemistry

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413822365

FWCI:

Cites: 8

Cited by:

Related to: 10