Reliability Analysis of ETL/Perovskite/HTL Interface Cracks on Perovskite Solar Cell Performance through FEM
Year: 2025
Type: conference-paper
Authors: Sulove Timsina, Hansung Kim
Institution: Purdue University Northwest
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4413822783
