Work

Assessing the LECO Process: Its Impact on TOPCon Solar Cell and Module Reliability

Year: 2025

Type: conference-paper

Source: Conference record of the IEEE Photovoltaic Specialists Conference

DOI: 10.1109/pvsc59419.2025.11132708

Authors: Olatz Arriaga Arruti, Bénédicte Bonnet-Eymard, Matthieu Despeisse, Christophe Ballif

Institution: Swiss Center for Electronics and Microtechnology (Switzerland)

Language: English

Topic: Silicon and Solar Cell Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Affordable and clean energy, Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4413822853

FWCI:

Cites: 5

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Related to: 10