Work

UV-Induced Degradation in N-Type TOPCon Modules: Exploring Metastability and Recovery Pathways

Year: 2025

Type: conference-paper

Source: Conference record of the IEEE Photovoltaic Specialists Conference

DOI: 10.1109/pvsc59419.2025.11132882

Authors: Archana Sinha, Jean-Nicolas Jaubert, Dana B. Kern, Todd Karin

Institution: National Laboratory of the Rockies

Language: English

Topic: Silicon and Solar Cell Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Affordable and clean energy

Open Access status: closed

Funder: U.S. Department of Energy

OpenAlex ID: W4413822917

FWCI: 4.717

Cites: 5

Cited by: 2

Related to: 10