Work

Multi-modal X-ray microscopy reveals defect-poor (Ag,Cu)(In,Ga)Se2 supergrains with outstanding charge-carrier lifetime

Year: 2025

Type: conference-abstract

Source: Conference record of the IEEE Photovoltaic Specialists Conference

DOI: 10.1109/pvsc59419.2025.11132740

Authors: Niklas Pyrlik, Christina Ossig, Sven Hampel, Jackson L. Barp, Gero Falkenberg, Giovanni Fevola, Christian Strelow, Tobias Kipp, Jan Garrevoet, Gerald Falkenberg, Fan Fu, Romain Carron, Michael E. Stuckelberger

Institution: Deutsches Elektronen-Synchrotron DESY

Language: English

Topic: Chalcogenide Semiconductor Thin Films

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Affordable and clean energy

Open Access status: closed

OpenAlex ID: W4413823044

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