Work

Sensitivity Analysis of Carrier Recombination Lifetime Measurements on Silicon Solar Cells due to Input Parameter Uncertainty

Year: 2025

Type: conference-abstract

Source: Conference record of the IEEE Photovoltaic Specialists Conference

DOI: 10.1109/pvsc59419.2025.11133266

Authors: Adrienne Blum, Harrison Wilterdink, Ronald Sinton

Institution: Sinton Instruments

Language: English

Topic: Silicon and Solar Cell Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Affordable and clean energy

Open Access status: closed

OpenAlex ID: W4413823121

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