Work

Impact of Data Quality on defect classification in electroluminescence images of Photovoltaic Cells

Year: 2025

Type: conference-paper

Source: Conference record of the IEEE Photovoltaic Specialists Conference

DOI: 10.1109/pvsc59419.2025.11132473

Authors: Armin Matindoust, Evgenii Sovetkin, Andreas Gerber, Liviu Stoicescu, Pascal Kölblin, Bart E. Pieters

Institutions: Forschungszentrum Jülich, Solarzentrum Stuttgart (Germany)

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413823208

FWCI: 2.473

Cites: 2

Cited by: 1

Related to: 10