Work

Reliability of photoconductance decay measurements of samples with significant carrier lifetime inhomogeneity

Year: 2025

Type: conference-paper

Source: Conference record of the IEEE Photovoltaic Specialists Conference

DOI: 10.1109/pvsc59419.2025.11132913

Authors: Gergely Havasi, Dávid Krisztián, Nerea Dasilva Villanueva, David Fuertes Marrón, Carlos del Cañizo, Ferenc Korsós

Institutions: Semilab (Hungary), Universidad Politécnica de Madrid

Language: English

Topic: Silicon and Solar Cell Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413823272

FWCI:

Cites: 6

Cited by:

Related to: 10