Work

Current-Resolved Electroluminescence Imaging for Assessing Potential Induced Degradation Shunting Recovery in c-Si PV Modules

Year: 2025

Type: conference-paper

Source: Conference record of the IEEE Photovoltaic Specialists Conference

DOI: 10.1109/pvsc59419.2025.11132938

Authors: Ravi Kumar, Rajesh Gupta

Institution: Indian Institute of Technology Bombay

Language: English

Topic: Silicon and Solar Cell Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Affordable and clean energy

Open Access status: closed

Funder: Ministry of Education

OpenAlex ID: W4413823321

FWCI:

Cites: 7

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Related to: 10