Work

Unsupervised Structural Defect Classification via Real-Time and Noise-Robust Method in Smartphone Small Modules

Year: 2025

Type: article

Abstract: Demand for OIS (Optical Image Stabilization) actuator modules, developed for shake correction technologies in industries such as smartphones, drones, IoT, and AR/VR, is increasing. To enable real-time and precise inspection of these modules, an AI algorithm that maximizes defect detection accuracy is required. This study proposes an unsupervised learning-based algorithm that is robust to noise and capable of real-time processing for accurate defect classification of OIS actuators in a smart factory environment. The proposed algorithm performs noise-reduction preprocessing, considering the sensitivity of small components and lighting imbalances, and defines three dynamic Regions of Interest (ROIs) to address positional deviations. A customized AutoEncoder (AE) is trained for each ROI, and defect classification is conducted based on reconstruction errors, followed by a final comprehensive decision. Experimental results show that the algorithm achieves an accuracy of 0.9944 and an F1 score of 0.9971 using only a camera without the need for expensive sensors. Furthermore, it demonstrates an average processing time of 2.79 ms per module, ensuring real-time capability. This study contributes to precise quality inspection in smart factories by proposing a robust and scalable unsupervised inspection algorithm.

Source: Electronics

DOI: 10.3390/electronics14173455

Authors: Sehun Lee, Taehoon Kim, Sookyun Kim, Junho Ahn, Namgi Kim

Institutions: Kyonggi University, Jeju National University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: gold

Estimated APC paid: $2,896