Year: 2025
Type: article
Abstract: This brief presents a novel monolithic ultra-low leakage current sensor with large dynamic range. The sensor features an integrated digitizing circuit that generates digital output corresponding to changing leakage current levels, eliminating the need for an explicit ADC. Fabricated in a 180nm BCD process, the sensor occupies just 0.0234mm2of area, consumes 3.1mW of power and operates at 3.125 MHz. It achieves a dynamic range of 25 pA to 5.5μA, outperforming previous publications by several orders of magnitude. Measurement results demonstrate the sensor’s accuracy, with INL and DNL remaining below 0.4 LSB across a temperature range of −40°C to 125°C. The sensor’s ultra-low sensing capability and wide dynamic range make it suitable for time-dependent dielectric breakdown (TDDB) characterization and in-field reliability monitoring of circuits, enhancing reliability assessments in safety-critical systems.
Authors: Emmanuel Nti Darko, Saeid Karimpour, Daniel Adjei, Kushagra Bhatheja, Degang Chen
Institutions: Iowa State University, Texas Instruments (United States)
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $2,645
Awards: G3033782000, G3397133718
OpenAlex ID: W4413847143