A Measurement‐Based 1‐ to 100‐GHz Lumped Model for On‐Chip Transformers With 3.2% Average Error
Year: 2025
Type: article
DOI: 10.1002/cta.70132
Authors: Hanqi Gao, Jing Jin, Jianjun Zhou
Institution: Shanghai Jiao Tong University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4413873137
