Work

Sniffing the Application Usage Information With the Leakage Current of Laptops

Year: 2025

Type: article

Source: IEEE Transactions on Mobile Computing

DOI: 10.1109/tmc.2025.3599338

Authors: Dian Ding, Yijie Li, Yongzhao Zhang, Yi-Chao Chen, Xiaoyu Ji, Guangtao Xue

Institutions: Shanghai Jiao Tong University, National University of Singapore, University of Electronic Science and Technology of China, Zhejiang University

Language: English

Topic: Security and Verification in Computing

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: Natural Science Foundation of Shanghai, National Natural Science Foundation of China

Awards: 边缘智能架构中资源优化分配关键技术研究, G4336681735, G6351238762

OpenAlex ID: W4413887022

FWCI: 0.408

Cites: 64

Cited by: 1

Related to: 10