Work

Camouflaged Logic Gates Using Threshold-Voltage-Defined Memory Cells

Year: 2025

Type: article

Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems

DOI: 10.1109/tvlsi.2025.3601192

Authors: Min-Woo Kim, Jae-Mun Oh, Byung-Do Yang

Institutions: Chungbuk National University, Electronics and Telecommunications Research Institute

Language: English

Topic: Physical Unclonable Functions (PUFs) and Hardware Security

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Research Foundation of Korea

Award: G8835988299

OpenAlex ID: W4413887150

FWCI:

Cites: 8

Cited by:

Related to: 10