Work

Developments in Measurement Electronics for Indian Plasma Diagnostic Sensor Probes

Year: 2025

Type: article

Source: IEEE Instrumentation & Measurement Magazine

DOI: 10.1109/mim.2025.11146569

Authors: Sreehari B. Nair, Anoop Chandrika Sreekantan, Sudharshan Kaarthik, Umesh R. Kadhane, V. S. Sooraj

Language: English

Topic: Plasma Diagnostics and Applications

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413887305

FWCI:

Cites: 18

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Related to: 10