Work

Assessing Long-Term Reliability Through Accelerated Aging Stress Tests on a On-Chip Quality and Reliability Platform: A Band Gap Reference Case Study

Year: 2025

Type: conference-paper

Source: IEEE International Test Conference India (ITC India)

DOI: 10.1109/itcindia66078.2025.11141592

Authors: Shiv Shankar Gupta, Rahul Sharma, Javed S Gaggatur

Institution: Intel (India)

Language: English

Topic: Analog and Mixed-Signal Circuit Design

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413917129

FWCI: 2.903

Cites: 6

Cited by: 1

Related to: 10