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Machine Learning-Based High Vmin Prediction for Enhanced Pre-Silicon Reliability

Year: 2025

Type: conference-paper

Source: IEEE International Test Conference India (ITC India)

DOI: 10.1109/itcindia66078.2025.11141595

Authors: Sudheer Anumala, Satya Ramoji Chikkam, Yu Tin Cheong, Xin Rou Chong, Mohd Azwann Zulkefle

Institution: Intel (India)

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4413917145

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Cites: 6

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Related to: 10