Suppressing endurance degradation in lead-free perovskite Cs3Bi2Br9 memristors: Grain engineering via annealing temperature and grain boundary passivation with PEG additive
Year: 2025
Type: article
Source: Applied Physics Letters
DOI: 10.1063/5.0291189
Authors: Jian Liu, Xiaolong Zhou, Ying Nie, Junjun Ouyang, Juanjuan Qi, Jianqiang Luo, Ke Wang
Institution: East China University of Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G4196999938, G5707839955
OpenAlex ID: W4413928903