Work

Alleviation of self-heating degradation in polycrystalline silicon thin-film transistors via voltage pulse modulation

Year: 2025

Type: article

Source: Applied Physics Letters

DOI: 10.1063/5.0274914

Authors: Pengfei Liu, Meng Zhang, Lanrong Zou, Zhendong Jiang, Lei Lu, Man Wong, Hoi-Sing Kwok

Institutions: Shenzhen University, Peking University, Hong Kong University of Science and Technology

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G3097323869

OpenAlex ID: W4413952661

FWCI: 0.451

Cites: 29

Cited by: 2

Related to: 10