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YOLO-DLL: an effective detection method for fabric defects

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Year: 2025
Type: article
Source: Textile Research Journal
DOI: 10.1177/00405175251348646
Authors: Siwei Xu, Chenglin Wan, Wenjie Feng, Junfeng Li, Jinfeng Gao
Institution: Zhejiang Sci-Tech University
Language: English

Topic: Industrial Vision Systems and Defect Detection
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Basic Public Welfare Research Program of Zhejiang Province
Awards: G7644886111, G935692505
OpenAlex ID: W4413963465
FWCI: 1.005
Cites: 32
Cited by: 2
Related to: 10
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