Reliability Modeling Analysis and Uncertainty Quantification Method for Electronic Systems With Multireliability Dependency
Year: 2025
Type: article
Source: IEEE Transactions on Reliability
Authors: Yanfang Wang, Ying Chen, Yingyi Li, Rui Kang
Institution: Beihang University
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G2358146137
OpenAlex ID: W4413967257