$D$-Optimal Sample Allocation of the Accelerated Life Tests Under Weibull Series Systems With Type-I Censoring Scheme
Year: 2025
Type: article
Source: IEEE Transactions on Reliability
Authors: Chih-Ying Tai, Tsai-Hung Fan, Chien-Yu Peng
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4413967280
