Work

Reconstructing Radiation Model of Chip in SiP Based on Magnetic Amplitude from Near-Field Scanning Measurements

Year: 2025

Type: article

Source: IEEE Transactions on Electromagnetic Compatibility

DOI: 10.1109/temc.2025.3600686

Authors: Yaya Liang, Wei Zhang, Pan Ren, Kaijin Wang, Xiaojie Li, Pingan Du

Institution: University of Electronic Science and Technology of China

Language: English

Topic: Electromagnetic Compatibility and Measurements

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Awards: G7515114456, G8603420406

OpenAlex ID: W4413967352

FWCI: 0.462

Cites: 28

Cited by: 2

Related to: 10