Reliability, Security, and Sustainability Challenges in 3-D NAND Flash SSDs
Year: 2025
Type: article
Source: IEEE Design and Test
Institutions: Colorado State University, Micron (United States)
Language: English
Subfield: Computer Networks and Communications
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
Funder: National Science Foundation
Awards: CNS Core: Small: Ensuring Privacy by Runtime Analog Sanitization of Solid State Storage Devices, Collaborative Research: SaTC: CORE: Small: Exploring Security Risks Arising from SRAM Data Remanence and Evaluating Innovative Sanitization Techniques, CAREER: Leveraging physical properties of modern flash memory chips for resilient, secure, and energy-efficient edge storage systems, EAGER: SaTC: Applying Adversarial Machine Learning Techniques to Recover Deleted Information from Flash Storage
OpenAlex ID: W4413977946