Work

Distinguishing the Different Vth Shift Mechanisms in In₂O₃ TFTs Using Ultrafast On-the-Fly Reliability Measurements

Year: 2025

Type: article

Source: IEEE Electron Device Letters

DOI: 10.1109/led.2025.3606332

Authors: Chien-Hung Yeh, Chang Niu, Jian-Yu Lin, Zehao Lin, Chang Liu, Juanjuan Lu, Sumi Lee, Haiyan Wang, Ting-Chang Chang, Peide D. Ye

Institutions: National Sun Yat-sen University, Purdue University West Lafayette

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Semiconductor Research Corporation

OpenAlex ID: W4413978021

FWCI: 0.676

Cites: 21

Cited by: 3

Related to: 10