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Enhanced Deep Learning for Real-Time Fabric Defect Detection in Textile Manufacturing

Year: 2025

Type: conference-paper

Source: International Conference for Emerging Technology (INCET)

DOI: 10.1109/incet64471.2025.11140323

Authors: K. Valarmathi, P. A. Mathina, S Mahalakshmi, P. Santhiya, J. Pavithra

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4413978558

FWCI: 15.16

Cites: 19

Cited by: 6

Related to: 10