Work

PCB Defect Identification and Localisation Using YOLOv10m

Year: 2025

Type: conference-paper

Source: International Conference for Emerging Technology (INCET)

DOI: 10.1109/incet64471.2025.11140345

Authors: Shreevatsa Alawandi, Umer Kudachi, Aishwarya Beedanal, Kaushik Mallibhat

Institution: KLE Technological University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4413979200

FWCI:

Cites: 16

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Related to: 10