Year: 2025
Type: article
Abstract: Microwave Absorbing Materials In this cover image, the main focus is an atomic layer atop an electromagnetic wave-absorbing device layer, illustrating the core concept of the work: establishing the relationship between absorbing materials and absorbing devices. When an electromagnetic wave is incident on the material, the device layer reflects three distinct matching mechanisms–perfect matching, partial matching, and mismatch–closely tied to the discussions in article 10.1002/aelm.202500239 by Liang Qiao, Fashen Li, and co-workers.
Source: Advanced Electronic Materials
DOI: 10.1002/aelm.70084
Institution: Lanzhou University
Language: English
Field: Materials Science
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $3,560
OpenAlex ID: W4413990027
