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A Lightweight Deep Learning Framework for Chinese and Western Pastry Texture Evaluation and Defect Detection

Year: 2025

Type: article

Source: Recent Advances in Electrical & Electronic Engineering (Formerly Recent Patents on Electrical & Electronic Engineering)

DOI: 10.2174/0123520965399383250806071752

Authors: Zhou Mengmeng, Li Heng

Institution: Jiangsu Food and Pharmaceutical Science College

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Zero hunger

Open Access status: closed

OpenAlex ID: W4413998545

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