Comparison of the charge transport properties of low and high flux grade redlen CdZnTe crystals
Year: 2025
Type: article
Abstract: CdZnTe is widely used in gamma ray radiation detection for medical imaging and security, with growing interest in CdZnTe for synchrotron and XFEL detector materials at X-ray fluxes in excess of 10 10 photons·s -1 mm -2 . Understanding fundamental material properties allows for greater understanding of the relevancy of CdZnTe for use at photon light sources. This investigation uses alpha particle spectroscopy to directly compare the mobility-lifetime products (μτ) and mobilities (μ) of High-Flux (HF) and Low-Flux (LF) CdZnTe, produced by Redlen Technologies, and ascertain the differences in bulk charge carrier properties for both electrons and holes. This work presents average values of HF-CdZnTe to be μ e = 920 cm V -1 s -1 , μ h = 38 cm V -1 s -1 , μ e τ e = 4.4 × 10 -3 cm V -1 s -1 , μ h τ h = 1.6 × 10 -4 cm V -1 s -1 and LF-CdZnTe with μ e = 840 cm V -1 s -1 , μ e τ e = 12 × 10 -3 cm V -1 s -1 , μ h τ h = 0.4 × 10 -4 cm V -1 s -1 .
Source: Journal of Instrumentation
Authors: M. Bishop, M.C. Veale, S.L. Bugby, F.K. Dejene, M. Bettelli, S. Zanettini
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: hybrid
Estimated APC paid: $3,290
OpenAlex ID: W4414016683