Effect of Si and Ti5Si3 on the adhesion at the α-Al2O3/γ-TiAl interface and oxygen diffusion in the alloy
Year: 2025
Type: article
Abstract: The effect of silicon and Ti5Si3 films on the adhesion properties of the α-Al2O3/γ-TiAl interface and oxygen diffusion in TiAl was studied using the projector augmented-wave method within density functional theory. It was shown that the formation of intermediate silicide layers at the oxide–alloy interface can lead to a significant decrease in the oxygen diffusion coefficient. At the same time, adhesion at the oxide–silicide interface remains high, while for the silicide–alloy interface, the values of ∼2.26–2.80 J/m2 typical for interfaces with metallic and metal-covalent bonds were obtained.
Authors: A. V. Bakulin, L. S. Chumakova, S. E. Kulkova
Language: English
Subfield: Mechanical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: diamond
Award: G7102093267
OpenAlex ID: W4414023609
