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A Lightweight Wafer Defect Pattern Recognition Network Based on Dynamic Snake Convolution

Year: 2025

Type: conference-paper

Source: IEEE International Conference on Image Processing and Computer Applications (ICIPCA)

DOI: 10.1109/icipca65645.2025.11138732

Authors: Ke Wang, Chengzhi Luo, Xuehu Zhan, Yaoyun Zhang, Haotian Weng, Liping Yuan

Institution: Wuhan Huaxia University of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Natural Science Foundation of Hubei Province

Award: G5479634964

OpenAlex ID: W4414037050

FWCI:

Cites: 7

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Related to: 10