Intelligent Electric Meter Reliability Assessment Based on Improved SVM
Year: 2025
Type: conference-paper
Authors: Shunhui Luo, Tao Li, Afeng Tan, Biao Chen, Ronggui Li
Language: English
Topic: Smart Grid and Power Systems
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414055272