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A Digital Partial Discharge Defect Model Based on K-Means Clustering

Year: 2025

Type: conference-paper

DOI: 10.1109/icaidt66272.2025.00059

Authors: Yanjie Zhang, Shuoheng Hu, Minghe Cheng, Lina Chen, Xi Wang, Aijing Li, Yingjie Xu, Guoliang Huang

Institutions: State Grid Corporation of China (China), Central South University of Forestry and Technology

Language: English

Topic: High voltage insulation and dielectric phenomena

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4414055312

FWCI:

Cites: 1

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Related to: 10